Title :
Impact of ringing on switching losses of wide band-gap devices in a phase-leg configuration
Author :
Zheyu Zhang ; Ben Guo ; Wang, F. ; Tolbert, Leon M. ; Blalock, Benjamin J. ; Zhenxian Liang ; Puqi Ning
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
This paper investigates the effects of ringing on the switching losses of wide band-gap (WBG) devices in a phase-leg configuration. An analytical switching loss model considering the parasitic inductance, stray resistance, devices´ junction capacitances, and reverse recovery characteristics of the freewheeling diode is derived to identify the switching energy dissipation induced by damping ringing. This part of energy is found to be at most the reverse recovery energy and the energy stored in the parasitics, which is a small portion of the total switching energy. But the parasitic ringing causes interference between two devices in a phase-leg (i.e., cross talk). It is observed that during the turn-on transient of one device, the resonance among parasitics results in high overshoot voltage on the complementary device in a phase-leg. It worsens the cross talk, leading to large shoot-through current and excessive switching losses. The analysis results have been verified by double pulse test with a 1200 V SiC MOSFETs based phase-leg power module.
Keywords :
damping; electric resistance; electromagnetic interference; inductance; power MOSFET; power conversion; semiconductor diodes; silicon compounds; switching transients; wide band gap semiconductors; MOSFET based phase-leg power module; SiC; WBG devices; analytical switching loss model; cross talk; damping ringing; double pulse test; freewheeling diode; high overshoot voltage; interference; junction capacitances; parasitic inductance; parasitic ringing; phase-leg configuration; reverse recovery energy characteristics; shoot-through current; stray resistance; switching energy dissipation; voltage 1200 V; wide band-gap devices; Capacitance; Damping; Energy dissipation; Energy loss; Switches; Switching loss; Transient analysis;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
Conference_Location :
Fort Worth, TX
DOI :
10.1109/APEC.2014.6803661