DocumentCode :
1332582
Title :
Design for nonsymmetrical statistical distributions
Author :
Wojciechowski, Jacek ; Vlach, Jiri ; Opalski, Leszek
Author_Institution :
Inst. of Electron. Fundamentals, Warsaw Univ. of Technol., Poland
Volume :
44
Issue :
1
fYear :
1997
fDate :
1/1/1997 12:00:00 AM
Firstpage :
29
Lastpage :
37
Abstract :
This paper presents a method for approximation of the constraint region and design centering for statistically distributed design parameters. Arbitrary uncorrelated probability density functions (p.d.f.´s) are considered, including truncated ones. The approximation problem is formulated deterministically and solved by optimization. The constraint region is approximated by a family of second-order ellipsoidal type functions. Formulation of the approximation problem takes into account statistical distributions of parameters, to be used in subsequent design centering. A special metric replaces evaluation of a multidimensional (yield) integral over the constraint region by simple integrals over fixed intervals. An additional outcome of the approximation process is location of a nominal design that increases yield
Keywords :
approximation theory; constraint theory; design engineering; optimisation; statistical analysis; approximation; constraint region; design centering; design parameters; ellipsoidal function; metric; nonsymmetrical statistical distribution; optimization; probability density function; yield; Circuit simulation; Circuit testing; Costs; Design methodology; Design optimization; Electronic circuits; Multidimensional systems; Probability density function; Production; Statistical distributions;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.558439
Filename :
558439
Link To Document :
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