DocumentCode :
1332745
Title :
Microstructural Characterization of La- and Ti-Codoped Multiferroic BiFeO 
Epitaxial Thin Films
Author :
Yi Yu ; Xiaozhong Zhang ; Qianping Chen ; Yonggang Zhao
Author_Institution :
Dept. of Mater. Sci. & Eng., Tsinghua Univ., Beijing, China
Volume :
47
Issue :
10
fYear :
2011
Firstpage :
3780
Lastpage :
3782
Abstract :
La- and Ti-codoped multiferroic BiFeO3 (BLFTO) epitaxial thin films were grown on (001) SrTiO3 (STO) substrates by pulsed laser deposition (PLD) technique. The microstructure of BLFTO thin film had been intensively studied by using transmission electron microscopy (TEM). It was found that La-and Ti-codoping can reduce leakage current and improve ferroelectric behavior of BiFeO3 without changing its structure. The correlation of microstructure with electrical property is discussed.
Keywords :
bismuth compounds; epitaxial layers; ferroelectric thin films; iron compounds; lanthanum; leakage currents; multiferroics; pulsed laser deposition; titanium; transmission electron microscopy; BiFeO3:La,Ti; SrTiO3; TEM; electrical property; ferroelectric property; leakage current; microstructural property; multiferroic epitaxial thin films; pulsed laser deposition; transmission electron microscopy; Chemicals; Doping; Epitaxial growth; Iron; Leakage current; Microstructure; BiFeO $_{3}$ ; leakage; microstructure; multiferroic;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2011.2150204
Filename :
6028264
Link To Document :
