Title :
Assessment of Irregular Sampling Near-Field Far-Field Transformation Employing Plane-Wave Field Representation
Author :
Schmidt, C.H. ; Eibert, Thomas F.
Author_Institution :
Lehrstuhl fur Hochfrequenztech., Tech. Univ. Munchen, Munich, Germany
fDate :
6/1/2011 12:00:00 AM
Abstract :
Near-field antenna measurements are accurate and common techniques for determining the radiation pattern of an antenna under test. The minimum near-field sampling rate is dictated by the electrical size of the antenna. Equidistant sampling is usually applied for planar, cylindrical, and spherical measurements. Certain applications either rely on or benefit from near-field sampling on irregular grids. To handle irregular measurement grids, near-field transformation algorithms such as equivalent-current methods or the multilevel fast multipole accelerated plane-wave based technique are required, which do not rely on regularly sampled data. In this contribution, the plane-wave-based near-field transformation is applied to spherical, cylindrical, and “combined” near-field measurements employing irregular sampling grids. The performance is assessed by various simulated near-field-measurement scenarios.
Keywords :
antenna radiation patterns; antenna theory; antenna radiation pattern; antenna under test; cylindrical measurements; electrical size; equidistant sampling; equivalent-current methods; irregular measurement grids; irregular sampling grids; irregular sampling near-field far-field transformation assessment; minimum near-field sampling rate; multilevel fast multipole accelerated plane-wave based technique; near-field antenna measurements; planar measurements; plane-wave field representation; spherical measurements; Antenna measurements; Antenna radiation patterns; Near-field radiation pattern; Sampling methods; Antenna radiation patterns; Multilevel Fast Multipole Algorithm (MLFMA); antenna measurements; full probe correction; irregular sampling; near field transformation; plane wave expansion;
Journal_Title :
Antennas and Propagation Magazine, IEEE
DOI :
10.1109/MAP.2011.6028465