• DocumentCode
    1333985
  • Title

    Susceptibility analysis of arbitrarily shaped 2-D slotted screens using a hybrid generalized scattering matrix finite-element technique

  • Author

    Tejedor, Juan V Balbastre ; Nuño, Luis ; Bataller, Miguel Ferrando

  • Author_Institution
    Dept. de Commicaciones, Univ. Politecnica de Valencia, Spain
  • Volume
    40
  • Issue
    1
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    47
  • Lastpage
    54
  • Abstract
    The electromagnetic susceptibility (EMS) inside slotted screens has been studied using a hybrid technique. The screen is characterized by a generalized admittance or impedance matrix, computed using the finite element method (FEM), which is then combined with a modal solution in free-space. The scattering matrix for the screen can then be easily computed. As a practical application, the electrical performance of a slotted square envelope has been studied. In general, it is shown that coupling to the interior of slotted screens is maximized at frequencies corresponding to resonances of the shorted screen, provided that the fields do not vanish near the aperture
  • Keywords
    S-matrix theory; electric admittance; electric impedance; electromagnetic interference; electromagnetic shielding; electromagnetic wave scattering; finite element analysis; matrix algebra; 2D slotted screens; EM coupling; EM fields; EM shielding; EMI protection; FEM; electrical performance; electromagnetic susceptibility; finite element method; free-space; generalized admittance matrix; generalized impedance matrix; hybrid generalized scattering matrix finite-element; modal solution; resonance frequencies; shorted screen; slotted square envelope; susceptibility analysis; Admittance; Boundary conditions; Circuits; Cutoff frequency; Electromagnetic scattering; Finite element methods; Impedance; Medical services; Resonance; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.659519
  • Filename
    659519