• DocumentCode
    1336062
  • Title

    Survivability of Inoculated Versus Naturally Grown Bacteria in Apple Juice Under Pulsed Electric Fields

  • Author

    El-Hag, Ayman H. ; Dadarwal, Renu ; Gonzalez, Oscar Rodriguez ; Jayaram, Shesha H. ; Griffiths, M.W.

  • Author_Institution
    Electr. Eng. Dept., American Univ. of Sharjah, Sharjah, United Arab Emirates
  • Volume
    46
  • Issue
    1
  • fYear
    2010
  • Firstpage
    9
  • Lastpage
    15
  • Abstract
    In this paper, the effect of different pulse and system parameters on the killing efficiency of pulsed electric field (PEF) treatment is investigated. Both Escherichia coli and naturally grown bacteria inoculated in apple juice were treated. Results showed that an electric field higher than 4 kV/mm is required to enhance the killing efficiency using PEF and achieve sufficient log reductions in the microbial numbers. The maximum temperature rise during pulse application was found to be around 35??C above ambient with the treated medium temperature reaching 41??C, and it is observed that this rise in medium temperature has synergistic effect and has resulted in high inactivation. As the temperature rise can be limited to a value below the pasteurization temperature, the synergistic effect can be highly beneficial. While a high killing rate was achieved for inoculated bacteria (up to 6-log reduction), less than 2-log reduction was achieved for naturally grown bacteria in apple juice under similar test conditions.
  • Keywords
    beverage industry; electric field effects; food preservation; Escherichia coli; apple juice; inoculated bacteria; killing efficiency; microbial numbers; naturally grown bacteria; pasteurization temperature; pulsed electric field treatment; sufficient log reductions; survivability; synergistic effect; Food processing; nonthermal pasteurization; pulsed electric field (PEF);
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2009.2036513
  • Filename
    5337965