• DocumentCode
    13362
  • Title

    Nano SNIS Junctions Fabricated by 3D FIB Sculpting for Application to Digital Electronics

  • Author

    Fretto, Matteo ; Enrico, E. ; De Leo, Natascia ; Boarino, Luca ; Rocci, Roberto ; Lacquaniti, Vincenzo

  • Author_Institution
    Ist. Naz. di Ricerca Metrol. (INRiM), Turin, Italy
  • Volume
    23
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    1101104
  • Lastpage
    1101104
  • Abstract
    Overdamped Josephson junctions based on a Nb/Al-AlOx/Nb superconductor-normal metal-insulator-superconductor structure were realized at the submicrometer scale by using focused ion beam nano-sculpting technique. This approach represents an alternative solution to the classical electron beam lithography and allows for an accurate control of the junction dimensions. Superconductor-normal metal-insulator-superconductor structured junctions were downscaled to about 300 × 300 nm2 and electrically measured at 4.2 K. The simple fabrication process, leading to high current density, Jc, and characteristic voltage, Vc, values and good uniformity, makes these junctions promising as elementary cell in complex circuits for rapid single flux quantum and ac voltage standard applications.
  • Keywords
    Josephson effect; current density; focused ion beam technology; nanofabrication; nanostructured materials; superconducting junction devices; 3D focused ion beam sculpting; Nb-Al-AlOx-Nb; ac voltage standard application; characteristic voltage; complex circuits; current density; digital electronics; electrical measurement; elementary cell; fabrication process; focused ion beam nanosculpting technique; junction dimension control; nanosuperconductor-normal metal-insulator-superconductor junctions; overdamped Josephson junctions; rapid single flux quantum application; submicrometer scale; superconductor-normal metal-insulator-superconductor structured junctions; temperature 4.2 K; Etching; Fabrication; Ion beams; Josephson junctions; Junctions; Niobium; Focused ion beam (FIB); rapid single flux quantum (RSFQ) technology; submicron dimension; superconductor—normal metal—insulator—superconductor (SNIS) Josephson junction; voltage metrology;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2013.2240759
  • Filename
    6413177