DocumentCode :
1337016
Title :
A 480 mW 2.6 GS/s 10b Time-Interleaved ADC With 48.5 dB SNDR up to Nyquist in 65 nm CMOS
Author :
Doris, Kostas ; Janssen, Erwin ; Nani, Claudio ; Zanikopoulos, Athon ; van der Weide, Gerard
Author_Institution :
NXP Semicond., Eindhoven, Netherlands
Volume :
46
Issue :
12
fYear :
2011
Firstpage :
2821
Lastpage :
2833
Abstract :
This paper presents a 64-times interleaved 2.6 GS/s 10b successive-approximation-register (SAR) ADC in 65 nm CMOS. The ADC combines interleaving hierarchy with an open-loop buffer array operated in feedforward-sampling and feedback-SAR mode. The sampling front-end consists of four interleaved T/Hs at 650 MS/s that are optimized for timing accuracy and sampling linearity, while the back-end consists of four ADC arrays, each consisting of 16 10b current-mode non-binary SAR ADCs. The interleaving hierarchy allows for many ADCs to be used per T/H and eliminates distortion stemming from open loop buffers interfacing between the front-end and back-end. Startup on-chip calibration deals with offset and gain mismatches as well as DAC linearity. Measurements show that the prototype ADC achieves an SNDR of 48.5 dB and a THD of less than 58 dB at Nyquist with an input signal of 1.4 . An estimated sampling clock skew spread of 400 fs is achieved by careful design and layout. Up to 4 GHz an SNR of more than 49 dB has been measured, enabled by the less than 110 fs rms clock jitter. The ADC consumes 480 mW from 1.2/1.3/1.6 V supplies and occupies an area of 5.1 mm.
Keywords :
CMOS integrated circuits; Nyquist criterion; analogue-digital conversion; buffer circuits; circuit optimisation; feedforward; field effect MMIC; harmonic distortion; integrated circuit layout; system-on-chip; 64-times interleaved successive-approximation-register ADC; ADC array; DAC linearity; SNDR; current-mode nonbinary SAR ADC; distortion stemming; feedback-SAR mode; feedforward-sampling; open loop buffer; open-loop buffer array; power 480 mW; sampling clock estimation; sampling linearity; size 65 nm; startup on-chip calibration; time-interleaved ADC; Bandwidth allocation; Capacitors; Converters; Interleaved codes; Jitter; Noise measurement; Analog-to-digital converter; Nyquist converter; calibration; clock jitter; direct sampling receiver; successive approximation register; time-interleaving; timing skew; track-and-hold;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2011.2164961
Filename :
6032044
Link To Document :
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