Title :
On Statistical Analysis of a DTL Gate
Author_Institution :
Ground Systems Div., Hughes Aircraft Co., Fullerton, Calif.
Keywords :
Capacitance; Circuits; Diodes; Mathematical model; Monte Carlo methods; Operational amplifiers; Resistors; Statistical analysis; Superconductivity; Voltage;
Journal_Title :
Electronic Computers, IRE Transactions on
DOI :
10.1109/TEC.1962.5219406
