Title :
An Evaluation of An Ultralow Background Alpha-Particle Detector
Author :
Gordon, Michael S. ; Heidel, David F. ; Rodbell, Kenneth P. ; Dwyer-McNally, Brendan ; Warburton, William K.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.
Keywords :
alpha-particle detection; ionisation chambers; IBM; ionization counter; low-emissivity materials; prototype ultralow background alpha particle counter; ultralow background alpha-particle detector; Alpha particles; Counting circuits; Detectors; Ionization; Lead; Packaging; Pollution measurement; Prototypes; Semiconductor materials; Tin; Alpha-particle detector; electronic signal rejection; ionization counter; low background;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2034001
