• DocumentCode
    1344990
  • Title

    Impulse testing for detection of insulation failure of motor winding and diagnosis based on Hidden Markov Model

  • Author

    Nakamura, Hisahide ; Chihara, Masaaki ; Inoki, Tomokazu ; Higaki, Taizo ; Okuda, Kazuo ; Mizuno, Yukio

  • Author_Institution
    R&D Div., TOENEC Corp., Nagoya, Japan
  • Volume
    17
  • Issue
    5
  • fYear
    2010
  • fDate
    10/1/2010 12:00:00 AM
  • Firstpage
    1619
  • Lastpage
    1627
  • Abstract
    Short circuit fault of a motor, due to breakdown of an insulating material of winding, is one of the most probable faults in motor drive systems. Establishment of an easy and effective fault diagnosis method has been strongly required to assure operation with high reliability. This paper proposes a novel diagnosis method for insulation failure of motor windings by a combination of impulse testing and pattern recognition based on Hidden Markov Model (HMM). A voltage waveform across two winding terminals is recorded under application of an impulse voltage. HMM is exploited to distinguish a small difference in voltage waveforms between healthy and faulty winding insulations. Usefulness of the proposed diagnostic method is verified through voltage waveforms experimentally obtained for motors with several kinds of turn-to-turn insulation failures.
  • Keywords
    fault diagnosis; hidden Markov models; impulse testing; induction motors; insulating materials; machine insulation; pattern recognition; stators; hidden Markov model; impulse testing; insulating materials; motor breakdown; motor short circuit fault diagnosis; motor winding insulation failure; pattern recognition; turn-to-turn insulation failures; voltage waveforms; Circuit faults; Hidden Markov models; Induction motors; Insulation; Stator windings; Voltage measurement; Windings; Hidden Markov Model, impulse test; fault diagnosis, insulation failure, stator winding;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2010.5595566
  • Filename
    5595566