DocumentCode :
1346176
Title :
OSNR Monitoring for NRZ-PSK Signals Using Silicon Waveguide Two-Photon Absorption
Author :
Xu, Ke ; Tsang, Hon Ki ; Lei, Gordon K P ; Chen, Yi Min ; Wang, Liang ; Cheng, Zhenzhou ; Chen, Xia ; Shu, Chester
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Volume :
3
Issue :
5
fYear :
2011
Firstpage :
968
Lastpage :
974
Abstract :
We study the use of two-photon absorption (TPA) in a silicon optical waveguide for measuring the optical signal-to-noise ratio (OSNR) of a nonreturn to zero phase-shift keying (NRZ-PSK) signal. The average photocurrent generated in the silicon waveguide increased by 70 nA (from 375 to 445 nA) for a change in OSNR from 28 to 6 dB and a constant total input power of 10 dBm. The nonresonant nature of the silicon waveguide TPA detector enables the simple measurement of OSNR over a continuous wide (>; 10 nm) wavelength range. For a 10-Gb/s NRZ-PSK signal, we show that when the residual dispersion in the optical signal exceeds 425 ps/nm, further increases in dispersion have little effect on the photocurrent. Thus, this TPA-based OSNR monitor can be used in practical systems with large dispersion.
Keywords :
optical dispersion; optical modulation; optical waveguides; phase shift keying; photoconductivity; silicon; two-photon processes; NRZ-PSK signals; bit rate 10 Gbit/s; current 375 nA to 445 nA; nonreturn to zero phase-shift keying; optical signal-to-noise ratio monitoring; residual dispersion; silicon optical waveguide; two-photon absorption; Monitoring; Optical noise; Optical waveguides; Photoconductivity; Signal to noise ratio; Silicon; Two-photon absorption (TPA); optical signal-to-noise ratio (OSNR) monitoring; silicon photonics;
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2011.2170832
Filename :
6041009
Link To Document :
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