• DocumentCode
    1346745
  • Title

    Investigation of Optical Performance of InGaN MQW LED With Thin Last Barrier

  • Author

    Yen, Sheng-Horng ; Tsai, Meng-Lun ; Tsai, Miao-Chan ; Chang, Shu-Jeng ; Kuo, Yen-Kuang

  • Author_Institution
    R&D Div., Epistar Co., Ltd., Hsinchu, Taiwan
  • Volume
    22
  • Issue
    24
  • fYear
    2010
  • Firstpage
    1787
  • Lastpage
    1789
  • Abstract
    In this work, the optical performance of the blue InGaN light-emitting diodes (LEDs) with varied last barrier thickness is investigated. The experimental measurement shows that the optical power of the InGaN LED with thinner last barrier is apparently improved. According to simulation analysis, thinner last barrier is beneficial for increasing the hole injection efficiency and holes can inject into more quantum wells within the active region. With better hole injection efficiency, the leakage electrons from active region to p-side layers are depressed correspondingly. Therefore, the radiative recombination and optical power are enhanced accordingly when the thinner last barrier is utilized.
  • Keywords
    III-V semiconductors; charge injection; electron-hole recombination; gallium compounds; indium compounds; leakage currents; light emitting diodes; semiconductor device models; semiconductor quantum wells; wide band gap semiconductors; InGaN; barrier thickness; blue light-emitting diodes; hole injection efficiency; leakage electrons; multiquantum well LED; p-side layers; radiative recombination; Charge carrier processes; Current density; Gallium nitride; Light emitting diodes; Mathematical model; Optical sensors; Radiative recombination; Light-emitting diodes (LEDs); quantum wells (QWs); semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2010.2085427
  • Filename
    5598516