• DocumentCode
    1346928
  • Title

    A 1.2-V 10- \\mu W NPN-Based Temperature Sensor in 65-nm CMOS With an Inaccuracy of 0.2 ^{\\circ}

  • Author

    Sebastiano, Fabio ; Breems, Lucien J. ; Makinwa, Kofi A A ; Drago, Salvatore ; Leenaerts, Domine M W ; Nauta, Bram

  • Author_Institution
    NXP Semicond., Eindhoven, Netherlands
  • Volume
    45
  • Issue
    12
  • fYear
    2010
  • Firstpage
    2591
  • Lastpage
    2601
  • Abstract
    An NPN-based temperature sensor with digital output has been realized in a 65-nm CMOS process. It achieves a batch-calibrated inaccuracy of (3σ ) and a trimmed inaccuracy of (3σ) over the temperature range from to 125 . This performance is obtained by the use of NPN transistors as sensing elements, the use of dynamic techniques, i.e., correlated double sampling and dynamic element matching, and a single room-temperature trim. The sensor draws 8.3 from a 1.2-V supply and occupies an area of 0.1 mm2
  • Keywords
    CMOS integrated circuits; correlation methods; signal sampling; temperature sensors; CMOS; correlated double sampling; dynamic element matching; npn transistor; power 10 muW; size 65 nm; temperature -70 C to 125 C; temperature sensor; voltage 1.2 V; CMOS analog integrated circuits; CMOS process; Intelligent sensors; Sigma delta modulation; Temperature sensors; CMOS analog integrated circuits; sigma-delta modulation; smart sensors; temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2010.2076610
  • Filename
    5598543