DocumentCode :
1347253
Title :
Parametric Analysis of 2-Unit Redundant Computer Systems With Corrective and Preventive Maintenance
Author :
Laprie, Jean-Claude ; Costes, Alain ; Landrault, Christian
Author_Institution :
Laboratoire d´´Automatique et d´´Analyse des Systémes (LAAS) du Centre National de la Recherche Scientifique; 7, avenue du Colonel Roche; 31400 Toulouse, FRANCE.
Issue :
2
fYear :
1981
fDate :
6/1/1981 12:00:00 AM
Firstpage :
139
Lastpage :
144
Abstract :
This paper shows the span of results which can be obtained by modeling a system´s behavior by stochastic processes and demonstrates practical rules for employing Markov and semi-Markov models. The introduction summarizes several methods for reliability analysis and gives the advantages and drawbacks of four methods: Markov processes, semi-Markov processes, supplementary variables, the method of stages. The remainder deals with reliability and availability modeling of a 2-unit redundant computer system. There are a) two types of maintenance: corrective (c. m.) and preventive (p. m.), and b) two system parameters: coverage, and an increased failure rate when one unit is under repair or inspection. Approximate expressions for reliability, mean time to failure, and asymptotic availability show the effects of the system parameters as well as of the shapes of the Cdf´s of the times related to maintenance actions. For c.m., Markov modeling is a good approximation. For p.m., Markov modeling is a rough approximation; one can go to semi-Markov models or to the method of stages. Lastly, an approximate expression is given for the mean inspection interval which maximizes reliability and availability for p.m.
Keywords :
Availability; Computer architecture; Failure analysis; Information processing; Inspection; Markov processes; Preventive maintenance; Reliability theory; Shape; Stochastic processes; Availability; Corrective maintenance; Markov model; Preventive maintenance; Semi-Markov model;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1981.5221008
Filename :
5221008
Link To Document :
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