Title :
Batteries: Unwanted memory spooks nickel-cadmium cells: New understanding of an undesirable phenomenon is the first step in avoiding it
Author :
Pensabene, S.F. ; Gould, J.W.
Author_Institution :
General Electric Co., Gainesville, FL, USA
Abstract :
The effect of undesirable phenomenon is defined as `an apparent reduction in capacity to a predetermined discharge voltage cut-off point (usually one volt) resulting from repetitive use patterns´. The suspected cause, and the reasons for its rarity, are explained after a brief discussion identifying the main components within a sintered-plate cell.
Keywords :
primary cells; Ni-Cd cell; capacity reduction; discharge voltage; electrolyte penetration; memory effect; repetitive use patterns; sintered plate type; Batteries; Cadmium; Chemicals; Discharges (electric); Materials; Particle separators; Random access memory;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1976.6367515
