DocumentCode
1349535
Title
Energy storage capacitors: aging, and diagnostic approaches for life validation
Author
Sarjeant, W.J. ; MacDougall, F.W. ; Larson, D.W. ; Kohlberg, I.
Author_Institution
State Univ. of New York, Buffalo, NY, USA
Volume
33
Issue
1
fYear
1997
fDate
1/1/1997 12:00:00 AM
Firstpage
501
Lastpage
506
Abstract
Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Recent innovations in analysis of aging, including dimensional analysis, are introduced for predicting component performance and fault tolerance. In addition, voltage scaling issues that may drive bank fault-tolerance performance are described
Keywords
ageing; capacitor storage; life testing; pulsed power technology; reliability; aging; capacitor reliability; component performance; diagnostic approaches; dimensional analysis; energy storage capacitors; fault tolerance; high energy pulse applications; life validation; manufacturing techniques; voltage scaling issues; Aging; Capacitors; Energy storage; Fault tolerance; Geometry; Insulation; Manufacturing; Materials reliability; Performance analysis; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.560063
Filename
560063
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