• DocumentCode
    1349540
  • Title

    High temperature superconductor resistive switch characteristics

  • Author

    Scholz, T.J. ; Barber, John P.

  • Author_Institution
    IAP Res. Inc., Dayton, OH, USA
  • Volume
    33
  • Issue
    1
  • fYear
    1997
  • fDate
    1/1/1997 12:00:00 AM
  • Firstpage
    507
  • Lastpage
    512
  • Abstract
    High Temperature Superconductor (HTSc) will switch from the superconducting state to the normal resistive state when an intrinsic critical current density is exceeded. We have measured the transition characteristics for HTSc thin films forced into transition by the application of voltage driven overcurrents. These thin films were used in the development of prototype HTSc fault current limiting devices. The prototype fault current limiters have exhibited excellent performance, combining low insertion loss during normal current conditions with rapid response and minimization of fault currents. This paper describes the results of several subscale power applications experiments which have demonstrated the usefulness of these devices. Also presented is an experiment demonstrating active switching of the devices to the resistive state. These experimental results will benefit researchers considering the use of HTSe switches for active control of current
  • Keywords
    critical current density (superconductivity); current limiters; high-temperature superconductors; superconducting switches; superconducting thin films; HTSc thin films; active switching; fault current limiting devices; fault currents; high temperature superconductor; insertion loss; intrinsic critical current density; subscale power applications; superconductive resistive switch; transition characteristics; voltage driven overcurrents; Critical current density; Fault current limiters; Fault currents; Force measurement; High temperature superconductors; Prototypes; Superconducting thin films; Switches; Thin film devices; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.560064
  • Filename
    560064