DocumentCode :
1350138
Title :
14-bit 2.2-MS/s sigma-delta ADC´s
Author :
Morizio, James C. ; Hoke, Michael ; Kocak, Taskin ; Geddie, Clark ; Hughes, Chris ; Perry, John ; Madhavapeddi, Srinadh ; Hood, Michael H. ; Lynch, George ; Kondoh, Harufusa ; Kumamoto, Toshio ; Okuda, Takashi ; Noda, Hiroshi ; Ishiwaki, Masahiko ; Miki,
Author_Institution :
Design Eng. Center-East, Mitsubishi Electron. America, Durham, NC, USA
Volume :
35
Issue :
7
fYear :
2000
fDate :
7/1/2000 12:00:00 AM
Firstpage :
968
Lastpage :
976
Abstract :
This paper presents the design and test results of a fourth-order and sixth-order 14-bit 2.2-MS/s sigma-delta analog-to-digital converter (ADC). The analog modulator and digital decimator sections were implemented in a 0.35 /spl mu/m CMOS double-poly triple-level metal 3.3-V process. The design objective for these ADC´s was to achieve 85 dB signal-to-noise distortion ratio (SNDR) with less than 200 mW power dissipation. Both modulators employ a cascade sigma-delta topology. The fourth-order modulator consists of two cascaded second-order stages which include 1-bit and 5-bit quantizers, respectively. The sixth-order modulator has a 2-2-2 cascade structure and 1-bit quantizer at the end of each stage. An oversampling ratio of 24 was selected to give the best SNDR and power consumption with realizable gain-matching requirements between the analog and digital sections.
Keywords :
CMOS integrated circuits; integrating circuits; mixed analogue-digital integrated circuits; modulators; quantisation (signal); sigma-delta modulation; switched capacitor networks; 0.35 micron; 14 bit; 2-2-2 cascade structure; 200 mW; 3.3 V; 85 dB; CMOS double-poly triple-level metal process; SNDR; analog modulator section; analog-to-digital converter; cascade sigma-delta topology; cascaded second-order stages; digital decimator section; fourth-order ADC; fourth-order modulator; gain-matching requirements; quantizers; sigma-delta ADC; signal-to-noise distortion ratio; sixth-order ADC; sixth-order modulator; Analog-digital conversion; CMOS process; Delta-sigma modulation; Digital modulation; Distortion; Power dissipation; Process design; Signal design; Testing; Topology;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.848205
Filename :
848205
Link To Document :
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