Title :
Guest Editors´ Introduction: Reliability of Embedded and Cyber-Physical Systems
Author :
Chillarege, Ram ; Voas, Jeffrey
Author_Institution :
Chillarege Inc.
Abstract :
Cyber-physical systems feature a tight combination of a system´s computational and physical elements. Understanding how to assess and design trustworthiness into these complex systems of systems remains an unsolved problem. This issue offers insights into various aspects of the problem.
Keywords :
Cyberspace; Data privacy; Embedded system; Reliability; Special issues and sections; cyber-physical systems; reliability; safety; security; trustworthiness;
Journal_Title :
Security & Privacy, IEEE
DOI :
10.1109/MSP.2010.152