Title :
Heavy Ion Testing With Iron at 1 GeV/amu
Author :
Pellish, Jonathan A. ; Xapsos, Michael A. ; LaBel, Kenneth A. ; Marshall, Paul W. ; Heidel, David F. ; Rodbell, Kenneth P. ; Hakey, Mark C. ; Dodd, Paul E. ; Shaneyfelt, Marty R. ; Schwank, James R. ; Baumann, Robert C. ; Deng, Xiaowei ; Marshall, Andrew
Author_Institution :
GSFC, Radiat. Effects & Anal. Group, NASA, Greenbelt, MD, USA
Abstract :
A 1 GeV/amu 56Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends at the GCR flux energy peak. Three SRAMs and an SRAM-based FPGA evaluated at the NASA Space Radiation Effects Laboratory demonstrate that a 90° tilt irradiation yields a unique device response. These tilt angle effects need to be screened for, and if found, pursued with radiation transport simulations to quantify their impact on event rate calculations.
Keywords :
SRAM chips; field programmable gate arrays; gas cooled reactors; ion beam effects; iron; nuclear electronics; 90° tilt irradiations; 56Fe ion beam; GCR flux energy peak; NASA Space Radiation Effects Laboratory; SRAM-based FPGA; event rate calculations; heavy ion testing; iron; microelectronic components; Arrays; Bars; CMOS integrated circuits; Iron; NASA; Random access memory; Testing; FPGA; SRAM; galactic cosmic ray; heavy ion testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2066575
