DocumentCode :
1353571
Title :
Causal RLGC( f ) Models for Transmission Lines From Measured S
Author :
Zhang, Jianmin ; Drewniak, James L. ; Pommerenke, David J. ; Koledintseva, Marina Y. ; Dubroff, Richard E. ; Cheng, Wheling ; Yang, Zhiping ; Chen, Qinghua B. ; Orlandi, Antonio
Author_Institution :
Cisco Syst., Inc., San Jose, CA, USA
Volume :
52
Issue :
1
fYear :
2010
Firstpage :
189
Lastpage :
198
Abstract :
Frequency-dependent causal RLGC(f) models are proposed for single-ended and coupled transmission lines. Dielectric loss, dielectric dispersion, and skin-effect loss are taken into account. The dielectric substrate is described by the two-term Debye frequency dependence, and the transmission line conductors are of finite conductivity. In this paper, three frequency-dependent RLGC models are studied. One is the known frequency-dependent analytical RLGC model (RLGC-I), the second is the RLGC( f) model (RLGC-II) proposed in this paper, and the third (RLGC-III) is same as the RLGC -II, but with causality enforced by the Hilbert transform in frequency domain. The causalities of the three RLGC models are corroborated in the time domain by examining the propagation of a well-defined pulse through three different transmission lines: a single-ended stripline, a single-ended microstrip line, and an edge-coupled differential stripline pair. A clear time-domain start point is shown on each received pulse for the RLGC-II model and the RLGC-III model, where their corresponding start points overlap. This indicates that the proposed RLGC(f) model (RLGC-II) is causal. Good agreement of simulated and measured S-parameters has also been achieved in the frequency domain for the three transmission lines by using the proposed frequency-dependent RLGC(f) model.
Keywords :
Hilbert transforms; S-parameters; coupled transmission lines; permittivity; skin effect; strip lines; Hilbert transform; RLGC(f) Models; S-parameters measurement; coupled transmission lines; dielectric dispersion; edge-coupled differential stripline pair; frequency-dependent causal models; single-ended microstrip line; skin-effect loss; transmission line conductors; Analytical models; Conductivity; Conductors; Couplings; Dielectric losses; Dielectric substrates; Frequency dependence; Frequency domain analysis; Stripline; Transmission lines; Causality; Hilbert transforms; dielectric materials; scattering parameters; transmission line modeling;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2009.2035055
Filename :
5352214
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