Title :
Some Optimal Designs for Grouped Data in Reliability Demonstration Tests
Author :
Wei, Duan ; Bau, Jinn-Jomp
Author_Institution :
Bureau of Statistics; Directorate-General of Budget; Accounting and Statistics; Executive Yuan; Taipei, TAIWAN-R.O. CHINA.
Abstract :
The paper considers optimal demonstration testdesigns with grouped inspection data from logistic, log-logistic, normal/Gaussian and log-normal distributions, along with the test statistics of the mean life and reliability for distributions.
Keywords :
Gaussian distribution; Inspection; Life testing; Log-normal distribution; Logistics; Maximum likelihood estimation; Measurement standards; Reliability theory; Statistical analysis; Statistical distributions; Estimation; Grouped data; Log-logistic distribution; Log-normal distribution; Logistic distribution; Normal/Gaussian distribution; Reliability demonstration; Reliability measurement; Testing;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1987.5222481
