Title :
Read Performance Reliability in TMR Head
Author :
Miyatake, Masami ; Kugiya, Fumio ; Kodama, Naoki
Author_Institution :
Hitachi Global Storage Technol. Japan, Ltd., Fujisawa, Japan
fDate :
3/1/2012 12:00:00 AM
Abstract :
Causes of head instability and design improvements in tunneling magnetoresistive heads are discussed. Head instability results in output signal amplitude changes and/or signal distortion due to the output noise. Under accelerated environmental conditions, a test using an original "V-H tester” was done to study and analyze the conditions of which instability occurs. From the result of the test, instability was classified into four categories. The improved sample heads were prepared, and the effectiveness was proved.
Keywords :
magnetic heads; magnetoresistive devices; reliability; tunnelling magnetoresistance; TMR head; V-H tester; head instability; read performance reliability; signal amplitude; signal distortion; tunneling magnetoresistive heads; Acceleration; Magnetic fields; Magnetic heads; Magnetization; Magnetomechanical effects; Noise; Tunneling magnetoresistance; $Delta V{-}H$ tester; Instability; thermal fly-height control (TFC); tunneling magnetoresistive (TMR) head;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2011.2173200