• DocumentCode
    1360486
  • Title

    Test economics in the 2lst Century

  • Author

    Turino, Jon

  • Author_Institution
    Integrated Meas. Syst., Beaverton, OR, USA
  • Volume
    14
  • Issue
    3
  • fYear
    1997
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    Although it is clearly risky to make predictions about what may occur several years in the future, sometimes such projections are necessary. If we have no idea where we are heading and why, the journey may be fraught with even more pitfalls than the constantly changing environment we live in today. And, although change is a constant, some things will stay the same as they have over the last decade or so because they are based on sound reasoning and market dynamics. The author explores the forces driving design validation testing and production testing as we move into the new century
  • Keywords
    economics; production testing; 2lst Century; design validation testing; market dynamics; production testing; test economics; Built-in self-test; Circuit testing; Computer aided engineering; Design engineering; Design for testability; Hardware; Product design; Product development; Production; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.605993
  • Filename
    605993