Title :
The economics of system-level testing
Author :
Farren, Des ; Ambler, Tony
Author_Institution :
Eur. Cellular Infrastructure Div., Motorola Inc., Cork, Ireland
Abstract :
Competitive pressure to streamline system-level test without affecting product quality is mounting. Identifying the features unique to system-level testing, the authors present key results of production testing based on a new test cost model
Keywords :
economics; production testing; systems analysis; product quality; production testing; system-level testing economics; test cost model; Application software; Computer applications; Computer errors; Costs; Environmental economics; Fault detection; Manufacturing; Production systems; Software testing; System testing;
Journal_Title :
Design & Test of Computers, IEEE
