Title :
Cryogenic indium-phosphide HEMT low-noise amplifiers at V-band
Author :
Tanskanen, J.M. ; Kangaslahti, P. ; Ahtola, H. ; Jukkala, P. ; Karttaavi, T. ; Lahdes, M. ; Varis, J. ; Tuovinen, J.
Author_Institution :
YLINEN Electron. Ltd., Kauniainen, Finland
fDate :
7/1/2000 12:00:00 AM
Abstract :
Indium-phosphide (InP) high electron-mobility transistors potentially have the lowest noise at frequencies below 100 GHz, especially when cryogenically cooled. We have designed monolithically integrated InP millimeter-wave low-noise amplifiers (LNAs) for the European Space Agency (ESA) science Planck mission. The Planck LNA´s design goal for noise temperature is 35 K at the ambient temperature of 20 K. The operation bandwidth is over 20% at 70 GHz. The maximum allowable power consumption for a Planck LNA (gain 20 dB) is Pbe =5 mW at 20 K. The chosen foundry for these LNA´s was DaimlerChrysler Research, Ulm, Germany. The DaimlerChrysler 0.18-μm InP process was used. This process is well suited for V-band LNA design, giving sufficient gain with very low noise. Several one-, two-, and three-stage amplifiers were designed. The best of them exhibited a noise figure lower than 5.5 dB with a gain higher than 14 dB over the 50-68-GHz range at room temperature. The best single-stage amplifier demonstrated a noise figure of 4.5 dB and a gain higher than 5 dS from 50 to 60 GHz at room temperature. On-wafer measurements on these monolithic-microwave integrated circuits (MMIC´s) have been done at MilliLab, Espoo, Finland. For the module fabrication, MMIC chips will be mounted in a WR-15 waveguide split-block housing
Keywords :
HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; cryogenic electronics; field effect MIMIC; indium compounds; integrated circuit measurement; millimetre wave amplifiers; space vehicle electronics; 0.18 micron; 20 K; 4.5 dB; 5 mW; 50 to 70 GHz; European Space Agency; HEMT low-noise amplifiers; InP; Planck mission; V-band; WR-15 waveguide split-block housing; ambient temperature; maximum allowable power consumption; millimeter-wave low-noise amplifiers; module fabrication; monolithic-microwave integrated circuits; multi-stage amplifiers; noise figure; noise temperature; on-wafer measurements; operation bandwidth; single-stage amplifier; Cryogenics; Frequency; Gain; HEMTs; Indium phosphide; Low-noise amplifiers; MODFETs; Millimeter wave transistors; Noise figure; Temperature;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on