DocumentCode
1361890
Title
LIMSoft: automated tool for sensitivity analysis and test vector generation
Author
Saab, K. ; Marche, D. ; Hamida, N.B. ; Kaminska, B.
Author_Institution
Ecole Polytech., Montreal, Que., Canada
Volume
143
Issue
6
fYear
1996
fDate
12/1/1996 12:00:00 AM
Firstpage
386
Lastpage
392
Abstract
In analogue circuits, deviation in component values causes deviation in the measured output parameters. The relation between the two deviations is the sensitivity function. The paper presents an automated sensitivity analysis tool called LIMSoft, based on the adjoint network method which offers the possibility of DC, AC and transient sensitivity computation. The sensitivity value is then used for soft-fault test vector generation
Keywords
analogue integrated circuits; circuit analysis computing; fault diagnosis; integrated circuit testing; sensitivity analysis; transient analysis; LIMSoft; adjoint network method; analogue circuits; component values; output parameters; sensitivity analysis; soft-fault test vector; test vector generation; transient sensitivity computation;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings -
Publisher
iet
ISSN
1350-2409
Type
jour
DOI
10.1049/ip-cds:19960934
Filename
561140
Link To Document