Title :
LIMSoft: automated tool for sensitivity analysis and test vector generation
Author :
Saab, K. ; Marche, D. ; Hamida, N.B. ; Kaminska, B.
Author_Institution :
Ecole Polytech., Montreal, Que., Canada
fDate :
12/1/1996 12:00:00 AM
Abstract :
In analogue circuits, deviation in component values causes deviation in the measured output parameters. The relation between the two deviations is the sensitivity function. The paper presents an automated sensitivity analysis tool called LIMSoft, based on the adjoint network method which offers the possibility of DC, AC and transient sensitivity computation. The sensitivity value is then used for soft-fault test vector generation
Keywords :
analogue integrated circuits; circuit analysis computing; fault diagnosis; integrated circuit testing; sensitivity analysis; transient analysis; LIMSoft; adjoint network method; analogue circuits; component values; output parameters; sensitivity analysis; soft-fault test vector; test vector generation; transient sensitivity computation;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
DOI :
10.1049/ip-cds:19960934
