DocumentCode
1362501
Title
Impedance and attenuation profile estimation of multilayered material from reflected ultrasound
Author
Chen, Tainsong ; Ho, Bong ; Zapp, H. Roland
Author_Institution
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Volume
40
Issue
4
fYear
1991
fDate
8/1/1991 12:00:00 AM
Firstpage
787
Lastpage
791
Abstract
Time-domain and spectral shift methods for determining the attenuation and impedance profiles of multilayered structures are presented. The time-domain technique utilizes two-sided interrogation to measure attenuation and acoustic impedance for individual layers separately under the assumption of a narrowband incident wave. This method is based solely on peak amplitude ratios of successive time-domain echo returns from both sides of the target. The spectral shift technique requires that the propagating pulse have a Gaussian-shaped spectrum, and the transfer function of each layer be characterized by either linear or quadratic frequency dependent attenuation. This method derives the attenuation coefficients and acoustic impedances for individual layers from the information of spectral shift and spectral amplitude peak ratios of the successive gated pulses from single sided interrogation. Experimental results are compared with published data to confirm the validity of these approaches
Keywords
acoustic impedance; attenuation measurement; time-domain reflectometry; ultrasonic materials testing; ultrasonic measurement; ultrasonic reflection; Gaussian-shaped spectrum; acoustic impedance; attenuation profile estimation; impedance measurement; impedance profiles; multilayered material; multilayered structures; narrowband incident wave; peak amplitude ratios; plexiglass; quadratic frequency dependent attenuation; reflected ultrasound; single sided interrogation; spectral amplitude peak ratios; spectral shift; time-domain; time-domain echo returns; tissue; transfer function; two-sided interrogation; Acoustic measurements; Acoustic propagation; Acoustic pulses; Acoustic waves; Attenuation measurement; Gaussian processes; Impedance measurement; Narrowband; Time domain analysis; Transfer functions;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.85357
Filename
85357
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