• DocumentCode
    1362547
  • Title

    Max-Min Distance Analysis by Using Sequential SDP Relaxation for Dimension Reduction

  • Author

    Bian, Wei ; Tao, Dacheng

  • Author_Institution
    Centre for Quantum Comput. & Intell. Syst., Univ. of Technol., Sydney, NSW, Australia
  • Volume
    33
  • Issue
    5
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    1037
  • Lastpage
    1050
  • Abstract
    We propose a new criterion for discriminative dimension reduction, max-min distance analysis (MMDA). Given a data set with C classes, represented by homoscedastic Gaussians, MMDA maximizes the minimum pairwise distance of these C classes in the selected low-dimensional subspace. Thus, unlike Fisher´s linear discriminant analysis (FLDA) and other popular discriminative dimension reduction criteria, MMDA duly considers the separation of all class pairs. To deal with general case of data distribution, we also extend MMDA to kernel MMDA (KMMDA). Dimension reduction via MMDA/KMMDA leads to a nonsmooth max-min optimization problem with orthonormal constraints. We develop a sequential convex relaxation algorithm to solve it approximately. To evaluate the effectiveness of the proposed criterion and the corresponding algorithm, we conduct classification and data visualization experiments on both synthetic data and real data sets. Experimental results demonstrate the effectiveness of MMDA/KMMDA associated with the proposed optimization algorithm.
  • Keywords
    data visualisation; face recognition; minimax techniques; pattern classification; FLDA; MMDA; data classification; data visualization; dimension reduction; max-min distance analysis; sequential SDP relaxation; sequential convex relaxation algorithm; Algorithm design and analysis; Approximation algorithms; Covariance matrix; Eigenvalues and eigenfunctions; Kernel; Optimized production technology; Fisher´s linear discriminant analysis; convex relaxation; data visualization; dimension reduction; pattern classification.;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2010.189
  • Filename
    5611542