• DocumentCode
    1362631
  • Title

    Parametric model fitting: from inlier characterization to outlier detection

  • Author

    Danuser, Gaudenz ; Stricker, Markus

  • Author_Institution
    Marine Biol. Lab., Woods Hole, MA, USA
  • Volume
    20
  • Issue
    3
  • fYear
    1998
  • fDate
    3/1/1998 12:00:00 AM
  • Firstpage
    263
  • Lastpage
    280
  • Abstract
    Presents a framework for the fitting of multiple parametric models. It comprises of a module for parameter estimation based on a solution for generalized least squares problems and of a procedure for error propagation, which takes both the geometric arrangement of the input data points and their precision into account. The results from error propagation are used to complement each model parameter with a precision estimate, to assign an inlier set of data points supporting the fit to each extracted model, and to determine the a priori unknown total number of meaningful models in the data. Although the models are extracted sequentially, the final result is almost independent of the extraction order. This is achieved by further statistical processing which controls the mutual exchange of inlier data between the models. Consequently, sound data classification as well as robust fitting are guaranteed even in areas where different models intersect or touch each other. Apart from the input data and its precision, the framework relies on only one additional control parameter: the confidence level on which the various statistical tests for data and model classification are carried out. We demonstrate the algorithmic performance by fitting straight lines in 2D and planes in 3D with applications to problems of computer vision and pattern recognition. Synthetic data is used to show the robustness and accuracy of the scheme. Image data and range data are used to illustrate its applicability and relevance in respect of real-world problems, e.g., in the domain of image feature extraction
  • Keywords
    computer vision; feature extraction; least squares approximations; parameter estimation; statistical analysis; computer vision; confidence level; data classification; error propagation; generalized least squares problems; image feature extraction; inlier characterization; model classification; outlier detection; parameter estimation; parametric model fitting; pattern recognition; precision estimate; robust fitting; statistical tests; Application software; Computer vision; Data mining; Least squares approximation; Parameter estimation; Parametric statistics; Pattern recognition; Process control; Robustness; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.667884
  • Filename
    667884