Title :
Instrumentation: Automated board testing: Coping with complex circuits: As printed circuit boards become harder to test due to VLSI components, automated systems and new design techniques are coming to the rescue
Author_Institution :
Western Electric Co., Princeton, NJ, USA
fDate :
7/1/1983 12:00:00 AM
Abstract :
As printed-circuit boards become harder to test due to VLSI components, automated systems and new design techniques are coming to the rescue. The author outlines the use of automatic test equipment (ATE).
Keywords :
automatic test equipment; electronic equipment testing; printed circuits; production testing; ATE; VLSI; automatic test equipment; printed-circuit boards; testing; Circuit faults; Dictionaries; Integrated circuit modeling; Printed circuits; Probes; Testing; Vectors;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1983.6369937
