DocumentCode :
1362982
Title :
A vector approach for noise parameter fitting and selection of source admittances
Author :
Callaghan, Juan M O ; Mondal, Jyoti P.
Author_Institution :
SRC Honeywell Inc., Bloomington, MN, USA
Volume :
39
Issue :
8
fYear :
1991
fDate :
8/1/1991 12:00:00 AM
Firstpage :
1376
Lastpage :
1382
Abstract :
Simple vector concepts can be used in the determination of noise parameters from measured data. The use of such concepts leads to a simplification in the least-square fitting algorithm, complete determination of the admittance loci that produce ill conditioning, and simple criteria for the selection of source admittances that minimize the sensitivity of the noise parameters to experimental error. The sensitivity of the noise parameters to small perturbations in the reflection coefficients is compared for a group of source admittances presented in previous work. The results show that a great reduction in the error of the noise parameters can be achieved by properly selecting the source admittances
Keywords :
electric admittance; electric noise measurement; measurement errors; error sensitivity; least-square fitting algorithm; noise parameter fitting; reflection coefficients; source admittances; vector approach; Acoustic reflection; Admittance; Computer errors; Differential equations; Helium; Impedance; Noise figure; Noise measurement; Noise reduction; Vectors;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.85413
Filename :
85413
Link To Document :
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