• DocumentCode
    1363685
  • Title

    Measured versus simulated transient disturbances induced on a system harness

  • Author

    Bandinelli, Mauro ; Bessi, Fulvio ; Chiti, Stefano ; Giorgi, Luca

  • Author_Institution
    Ingegneria Dei Sistemi SpA, Pisa, Italy
  • Volume
    38
  • Issue
    3
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    282
  • Lastpage
    289
  • Abstract
    The increasing complexity of electronic payloads on satellites and aircraft has resulted in an increase in electromagnetic compatibility (EMC) test campaign costs and duration. Affordable simulation tools can help system engineers to reduce costs and prevent damage during tests. A method of moments (MOM) based simulation tool for the analysis of electrostatic discharge (ESD) interactions with systems has been assessed. Comparisons between experimental and simulated results are reported together with the adopted setup modeling philosophy. The results showed a very good performance of the simulation tool and the need to characterize and include in the computation the experimental current probe model
  • Keywords
    aircraft instrumentation; digital simulation; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; electrostatic discharge; method of moments; satellite communication; simulation; transient analysis; EMC test; ESD analysis; aircraft; costs reduction; electromagnetic compatibility; electronic payloads; electrostatic discharge; experimental current probe model; experimental results; measured transient disturbance; method of moments; satellites; setup modeling; simulated results; simulated transient disturbance; simulation tools; system harness; Aerospace electronics; Aircraft; Computational modeling; Costs; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic transients; Electrostatic discharge; Payloads; Satellites;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.536057
  • Filename
    536057