• DocumentCode
    1364097
  • Title

    Methods for job configuration in semiconductor manufacturing

  • Author

    Connors, Daniel P. ; Yao, David D.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    9
  • Issue
    3
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    401
  • Lastpage
    411
  • Abstract
    Job configuration in semiconductor manufacturing refers to the process of configuring silicon wafers in terms of chip types and volumes, organizing collections of wafers into jobs, and determining the volume of jobs to be released into the production line. The difficulties of job configuration lie in the random yield loss, the numerous technological constraints, and the rigid set serviceability requirement (i.e., demand must be met in terms of all chip types). Motivated by the configuration problems in the “early-user hardware” development programs at some IBM plants, we develop here a systematic approach to job configuration. The centerpiece of the approach is a careful treatment of the set serviceability constraint, in terms of both probability and expectation. It solves the job configuration problem as separable convex programs using marginal allocation algorithms. Through numerical examples, we demonstrate that by allowing diversity of chip types at either the job- or the wafer-level, higher serviceability can be achieved using fewer wafers
  • Keywords
    semiconductor device manufacture; IBM plant; chip type; chip volume; constrained optimization; convex program; early-user hardware development program; expectation; job configuration; marginal allocation algorithm; probability; production line; random yield loss; semiconductor manufacturing; serviceability; silicon wafer; Circuit testing; Fabrication; Job production systems; Manufacturing processes; Organizing; Performance evaluation; Printed circuits; Semiconductor device manufacture; Semiconductor device modeling; Silicon;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.536111
  • Filename
    536111