• DocumentCode
    1364673
  • Title

    Reliability evaluation of combined k-out-of-n:F, consecutive-k-out-of-n:F and linear connected-(r, s)-out-of-(m, n):F system structures

  • Author

    Zuo, Ming J. ; Lin, Daming ; Wu, Yanhong

  • Author_Institution
    Dept. of Mech. Eng., Alberta Univ., Edmonton, Alta., Canada
  • Volume
    49
  • Issue
    1
  • fYear
    2000
  • fDate
    3/1/2000 12:00:00 AM
  • Firstpage
    99
  • Lastpage
    104
  • Abstract
    Based on a real industrial application, three new system reliability models are proposed: combined k-out-of-n:F and consecutive-k c-out-of-n:F system; combined k-out-of-m·n:F and linear connected-(r,s)-out-of-(m,n):F system; and combined k-out-of-m·n:F consecutive-kc-out-of-n:F and linear connected-(r,s)-out-of-(m,n):F system. Reliability evaluation algorithms are provided for these models. The computation times of the algorithms for these models are, respectively: O(n·k), O(k·n·2 m·sm-r+2), O(k·n·(2kc )sm-r+1). The algorithms are used for system reliability evaluation of furnace systems. The concept of the combined k-out-of-n:F and 1-dimensional and 2-dimensional consecutive-k-out-of-n:F systems can be extended to other variations of the consecutive-k-out-of-n:F systems, e.g., the consecutive-k-out-of-n:G system and 1-dimensional and 2-dimensional r-within-k-out-of-n:F systems. The concept of Markov chain imbeddable (MIS) systems is another excellent tool that can be used for analysis of such combined system structures
  • Keywords
    Markov processes; consecutive system reliability; failure analysis; Markov chain imbeddable systems; combined k-out-of-n:F system structures; combined system structures; computation times; consecutive-k-out-of-n:F structures; consecutive-kc,-out-of-n:F system structures; linear connected-(r, s)-out-of-(m, n):F system structures; reliability evaluation algorithms; Costs; Councils; Creep; Employee welfare; Furnaces; Hydrogen; Mathematics; Mechanical engineering; Reliability; Temperature;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.855542
  • Filename
    855542