DocumentCode :
1366513
Title :
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99
Volume :
47
Issue :
3
fYear :
2000
fDate :
6/1/2000 12:00:00 AM
Abstract :
The following topics were dealt with: space environment; radiation interaction with materials and simulations of effects on components; radiation metrology; irradiation facilities; transient effects; total dose effects on materials, transistors and circuits; processes and designs for integrated circuit hardening; methods for hardening equipment to radiation; use of standard components (COTS); tolerance of optoelectronic components; behaviour of optical components under radiation; selection methods and hardness assurance; laboratory and operational results
Keywords :
monolithic integrated circuits; optical elements; optical fibres; optoelectronic devices; radiation effects; radiation hardening (electronics); semiconductor devices; test facilities; COTS; RADECS; components; hardness assurance; integrated circuit hardening; irradiation facilities; laboratory results; operational results; optical components; optoelectronic component; radiation interaction; radiation metrology; selection methods; simulations; space environment; standard components; total dose effects; transient effects; transistors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.856467
Filename :
856467
Link To Document :
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