DocumentCode
1367028
Title
Chemical polishing of LSO crystals to increase light output
Author
Slates, Randal ; Chatziioannou, Arion ; Fehlberg, Brianna ; Lee, Taekyeung ; Cherry, Simon
Author_Institution
Dept. of Molecular & Med. Pharmacology, California Univ. Sch. of Med., Los Angeles, CA, USA
Volume
47
Issue
3
fYear
2000
fDate
6/1/2000 12:00:00 AM
Firstpage
1018
Lastpage
1023
Abstract
Surface treatment of scintillators is critical for light collection from narrow rectangular crystals. The authors investigated chemical polishing which is less labor intensive and expensive than hand and machine polishing. They used phosphoric acid to chemically polish LSO crystals at 110°C, 150°C and 190°C, and compared these with unpolished and mechanically polished crystals. Groups of five 2×2×10 mm crystals were etched for different times at each temperature. Weight loss, light output and energy resolution were measured as a function of treatment time and temperature. The authors found that chemical polishing can increase light output by 250% relative to unpolished crystals and by 16% relative to mechanically polished crystals. The energy resolution was relatively independent of surface treatment, with values of between 14 and 16%. The rate of loss of LSO was 0.02%/min at 110°C, 0.1%/min at 150°C and 0.36%/min at 190°C. Maximum light output occurred when 5-10% of the LSO was removed. The crystals were also imaged using scanning electron microscopy and the surface roughness quantitatively assessed by using a profilometer. These measurements helped to clarify the effect of acid polishing on the surface of the scintillator. In summary, chemical polishing appears to be a convenient and effective method for improving light output from small LSO crystals
Keywords
gamma-ray detection; polishing; positron emission tomography; solid scintillation detectors; 110 C; 150 C; 190 C; LSO crystals; PET; energy resolution; light output increase; mechanically polished crystals; narrow rectangular crystals; nuclear medicine; profilometer; scanning electron microscopy; small LSO crystals; surface roughness; treatment time; unpolished crystals; weight loss; Chemicals; Crystals; Energy measurement; Energy resolution; Etching; Loss measurement; Rough surfaces; Surface roughness; Surface treatment; Temperature;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.856541
Filename
856541
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