DocumentCode :
1367091
Title :
Constraining object features using a polarization reflectance model
Author :
Wolff, Lawrence B. ; Boult, Terrance E.
Author_Institution :
Columbia Univ., New York, NY, USA
Volume :
13
Issue :
7
fYear :
1991
fDate :
7/1/1991 12:00:00 AM
Firstpage :
635
Lastpage :
657
Abstract :
The authors present a polarization reflectance model that uses the Fresnel reflection coefficients. This reflectance model accurately predicts the magnitudes of polarization components of reflected light, and all the polarization-based methods presented follow from this model. The authors demonstrate the capability of polarization-based methods to segment material surfaces according to varying levels of relative electrical conductivity, in particular distinguishing dielectrics, which are nonconducting, and metals, which are highly conductive. Polarization-based methods can provide cues for distinguishing different intensity-edge types arising from intrinsic light-dark or color variations, intensity edges caused by specularities, and intensity edges caused by occluding contours where the viewing direction becomes nearly orthogonal to surface normals. Analysis of reflected polarization components is also shown to enable the separation of diffuse and specular components of reflection, unobscuring intrinsic surface detail saturated by specular glare. Polarization-based methods used for constraining surface normals are discussed
Keywords :
light polarisation; light reflection; optical information processing; pattern recognition; reflectivity; Fresnel reflection coefficients; color variations; electrical conductivity; intensity edges; intrinsic light-dark variations; machine vision; pattern recognition; polarization reflectance model; surface segmentation; Cameras; Computer vision; Dielectric materials; Fresnel reflection; Inspection; Machine vision; Optical polarization; Optical reflection; Predictive models; Reflectivity;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.85655
Filename :
85655
Link To Document :
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