Title :
The combinatorial design approach to automatic test generation
Author :
Cohen, David M. ; Dalal, Siddhartha R. ; Parelius, Jesse ; Patton, Gardner C.
Author_Institution :
Bellcore, NJ, USA
fDate :
9/1/1996 12:00:00 AM
Abstract :
The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability
Keywords :
automatic testing; program debugging; program testing; software cost estimation; systems analysis; automatic test generation; code coverage; combinatorial design approach; fault detection ability; program testing costs; test plan development; Automatic testing; Code standards; Costs; Design methodology; Fault detection; Medical tests; Reliability engineering; Software testing; System testing; User interfaces;
Journal_Title :
Software, IEEE
