DocumentCode :
1367962
Title :
Design of Impedance Measuring Circuits Based on Phase-Sensitive Demodulation Technique
Author :
Chen, Dixiang ; Yang, Wuqiang ; Pan, Mengchun
Author_Institution :
Sch. of Mechatron. Eng. & Autom., Nat. Univ. of Defense Technol., Changsha, China
Volume :
60
Issue :
4
fYear :
2011
fDate :
4/1/2011 12:00:00 AM
Firstpage :
1276
Lastpage :
1282
Abstract :
Impedance measuring circuits play a crucial role in an electrical impedance tomography system, in which capacitance and resistance need to be measured accurately at a high speed. Several impedance measuring circuits based on phase-sensitive demodulation (PSD) have been designed, tested, and presented in this paper. The measurement error is analyzed, and the mismatch of the measured capacitance and resistance is considered to be the main cause of the measurement error. A new impedance measuring circuit with dual-frequency PSD has been designed to solve this problem. It has been proven by experiment that this circuit can be used to measure both capacitance and resistance with an uncertainty of less than 0.5%.
Keywords :
analogue multipliers; capacitance measurement; circuit testing; demodulators; electric impedance imaging; measurement errors; capacitance measurement; dual-frequency phase-sensitive demodulation technique; electrical impedance tomography system; impedance measuring circuit; measurement error; resistance measurement; Analog multiplier; dual frequency; dual mode; electrical impedance tomography (EIT); phase-sensitive demodulation (PSD);
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2010.2084770
Filename :
5618560
Link To Document :
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