DocumentCode :
1368076
Title :
Feature selection by analyzing class regions approximated by ellipsoids
Author :
Abe, Shigeo ; Thawonmas, Ruck ; Kobayashi, Yoshiki
Author_Institution :
Dept. of Electr. & Electron. Eng., Kobe Univ., Japan
Volume :
28
Issue :
2
fYear :
1998
fDate :
5/1/1998 12:00:00 AM
Firstpage :
282
Lastpage :
287
Abstract :
In their previous work, the authors have developed a method for selecting features based on the analysis of class regions approximated by hyperboxes. They select features analyzing class regions approximated by ellipsoids. First, for a given set of features, each class region is approximated by an ellipsoid with the center and the covariance matrix calculated by the data belonging to the class. Then, similar to their previous work, the exception ratio is defined to represent the degree of overlaps in the class regions approximated by ellipsoids. From the given set of features, they temporally delete each feature, one at a time, and calculate the exception ratio. Then, the feature whose associated exception ratio is the minimum is deleted permanently. They iterate this procedure while the exception ratio or its increase is within a specified value by feature deletion. The simulation results show that the current method is better than the principal component analysis (PCA) and performs better than the previous method, especially when the distributions of class data are not parallel to the feature axes
Keywords :
computational geometry; covariance matrices; feature extraction; pattern classification; simulation; center; class region analysis; class region approximation; covariance matrix; ellipsoids; exception ratio; feature deletion; feature selection; hyperboxes; iteration; overlaps; simulation; Analytical models; Covariance matrix; Ellipsoids; Feature extraction; Laboratories; Mutual information; Neural networks; Pattern classification; Pattern recognition; Principal component analysis;
fLanguage :
English
Journal_Title :
Systems, Man, and Cybernetics, Part C: Applications and Reviews, IEEE Transactions on
Publisher :
ieee
ISSN :
1094-6977
Type :
jour
DOI :
10.1109/5326.669573
Filename :
669573
Link To Document :
بازگشت