DocumentCode
1368080
Title
Massively parallel algorithms for scattering in optical lithography
Author
Guerrieri, Roberto ; Tadros, Karim H. ; Gamelin, John ; Neureuther, Andrew R.
Author_Institution
Dipartimento di Elettronica e Inf., Bologna Univ., Italy
Volume
10
Issue
9
fYear
1991
fDate
9/1/1991 12:00:00 AM
Firstpage
1091
Lastpage
1100
Abstract
A novel massively parallel technique for rigorous simulation of topography scattering in optical lithography has been developed and tested. The method is equivalent to the time-domain finite-difference method (TDFDM) used in electromagnetic scattering simulations, but exploits the parallel nature of wave propagation and the power of recent massively parallel architectures such as the Connection Machine. A working code called TEMPEST has been implemented on a Connection Machine CM-2 having 1 to 32 K processors with up to 1 M virtual processors. Numerical accuracy comparable with that of other fully rigorous methods was achieved. A very significant finding was that the solution required constant time per iteration for problems ranging from a few thousand unknowns up to one million, provided the ratio between the problem size and the number of processors is kept constant. The suitability of TEMPEST for solving a large class of topography structures important in alignment, metrology, and lithography is illustrated by examples
Keywords
digital simulation; electronic engineering computing; light scattering; parallel algorithms; photolithography; CM-2; Connection Machine; TEMPEST; alignment; massively parallel technique; metrology; optical lithography; simulation; time-domain finite-difference method; topography scattering; wave propagation; working code; Electromagnetic propagation; Electromagnetic scattering; Finite difference methods; Lithography; Optical propagation; Optical scattering; Parallel algorithms; Surfaces; Testing; Time domain analysis;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.85755
Filename
85755
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