DocumentCode :
1368130
Title :
Soft X-ray yield measurement in a small plasma focus operated in neon
Author :
Liu, Mahe ; Feng, Xianping ; Springham, Stuart V. ; Lee, Sing
Author_Institution :
Nat. Inst. of Educ., Nanyang Technol. Univ., Singapore
Volume :
26
Issue :
2
fYear :
1998
fDate :
4/1/1998 12:00:00 AM
Firstpage :
135
Lastpage :
140
Abstract :
The United Nations University/International Center for Theoretical Physics Plasma Focus Facility (UNU/ICTP PFF), a small plasma focus, has proven very useful as a training device for research initiation and as a test bed for applications. In this work, its performance in terms of a soft X-ray (SXR) source is examined. The total SXR yield when operated in neon is measured using low-cost detectors, including a calorimeter and a five-channel filtered PIN system. For a charging voltage of 14 kV with 2.9 kJ stored energy, the optimum operating pressure in neon is found to be in the range of 2.7-3.3 torr, resulting in a total SXR yield of 6J/shot into 4π steradians measured by the calorimeter in agreement with the PIN detectors. Spectral data shows that 64% of the total SXR yield is contributed by the Ly-α and He-α lines and 36% by the rest, mainly the radiative recombination. The low total SXR yield (0.2 % of stored energy) is consistent with numerical computations of focus dynamics, which reveals that 3% of stored energy is converted into plasma energy. This low conversion rate into plasma energy is due to the large inductance of 110 nH of this simple single-capacitor device. Thus, for development as a SXR source, reduction of inductance is necessary
Keywords :
X-ray production; neon; plasma focus; 14 kV; 2.7 to 3.3 torr; 2.9 kJ; He-α lines; Ly-α lines; Ne; calorimeter; five-channel filtered PIN system; focus dynamics; low-cost detectors; optimum operating pressure; radiative recombination; single-capacitor device; small plasma focus; soft X-ray yield measurement; spectral data; Detectors; Inductance; Physics; Plasma applications; Plasma devices; Plasma measurements; Plasma sources; Plasma x-ray sources; Testing; Voltage;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.669614
Filename :
669614
Link To Document :
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