Title :
Design and optimization of five-phase fault-tolerant in-wheel permanent machine with low mutual-inductance
Author :
Ping Zheng ; Pengfei Wang ; Yi Sui ; Luming Cheng ; Tiecai Li
Author_Institution :
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
fDate :
Aug. 31 2014-Sept. 3 2014
Abstract :
In safety-critical applications, five-phase fault-tolerant permanent machines are attracting more and more attentions. In this paper, the synthesis of magnetomotive force (MMF) produced by the windings in five-phase machine is analyzed firstly. A method to eliminate the mutual-inductance in fault-tolerant machines is proposed and an approach of the pole-slot combination selection of the five-phase fault-tolerant machine with low-mutual inductance is given. Then a five-phase fault-tolerant in-wheel permanent machine is designed according to the requirements of the electric vehicle application. The basic dimensions of the machine are derived from the analytic machine design method. Finally, the finite-element model of the designed machine is built, and a method of machine parameter optimization is proposed with the help of the finite-element model. The waveform of the no-load back EMF, output torque and the fault-tolerant capacity have been taken into account in the optimization, which improves the performance of the machine.
Keywords :
electric machines; electric potential; electric vehicles; fault tolerance; finite element analysis; FEM; MMF; analytic machine design method; electric vehicle application; finite-element model; five-phase fault-tolerant in-wheel permanent machine; machine parameter optimization; magnetomotive force; mutual-inductance elimination; no-load back EMF; pole-slot combination selection; safety-critical applications; Air gaps; Fault tolerance; Fault tolerant systems; Harmonic analysis; Optimization; Torque; Windings; Fault-tolerant machine; Parameter optimization; Pole-slot combination;
Conference_Titel :
Transportation Electrification Asia-Pacific (ITEC Asia-Pacific), 2014 IEEE Conference and Expo
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-4240-4
DOI :
10.1109/ITEC-AP.2014.6941154