DocumentCode
1369997
Title
Nonlithographic nano-wire arrays: fabrication, physics, and device applications
Author
Routkevitch, Dmitri ; Tager, A.A. ; Haruyama, Junji ; Almawlawi, Diyaa ; Moskovits, Martin ; Xu, Jimmy M.
Author_Institution
Dept. of Chem., Toronto Univ., Ont., Canada
Volume
43
Issue
10
fYear
1996
fDate
10/1/1996 12:00:00 AM
Firstpage
1646
Lastpage
1658
Abstract
A novel system of nanostructures is described consisting of nonlithographically produced arrays of nano-wires directly electrodeposited into porous anodic aluminum oxide templates. Using this method regular and uniform arrays of metal or semiconductor nano-wires or nano-dots can be created with diameters ranging from ~5 nm to several hundred nanometers and with areal pore densities in the ~109-1011 cm-2 range. We report on the present state of their fabrication, properties, and prospective device applications. Results of X-ray diffraction, Raman and magnetic measurements on metal (Ni, Fe) and semiconductor (CdS, CdSe, CdSx Se1-x, CdxZn1-xS and GaAs) wires are presented. The I-V characteristics of two terminal devices made from the nano-arrays are found to exhibit room temperature periodic conductance oscillations and Coulomb-blockade like current staircases. These observations are likely associated with the ultra-small tunnel junctions that are formed naturally in the arrays. Single-electron tunneling (SET) In the presence of interwire coupling in these arrays is shown to lead to the spontaneous electrostatic polarization of the wires. Possible device applications such as magnetic memory or sensors, electroluminescent flat-panel displays, and nanoelectronic and single-electronic devices are also discussed
Keywords
arrays; electrodeposition; nanotechnology; quantum interference devices; semiconductor quantum wires; semiconductor technology; tunnelling; Al2O3; CdS; CdSSe; CdSe; CdZnS; Coulomb-blockade current staircase; Fe; GaAs; I-V characteristics; Ni; Raman measurements; X-ray diffraction; electrodeposition; electroluminescent flat-panel displays; fabrication; magnetic measurements; magnetic memory; magnetic sensors; metals; nanodots; nanoelectronic devices; nonlithographic nanowire arrays; periodic conductance oscillations; porous anodic aluminum oxide template; semiconductors; single-electron tunneling; single-electronic devices; spontaneous electrostatic polarization; two terminal devices; ultra-small tunnel junctions; Aluminum oxide; Fabrication; Iron; Magnetic variables measurement; Nanoscale devices; Physics; Semiconductor nanostructures; Wires; X-ray diffraction; Zinc;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.536810
Filename
536810
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