Title :
Stochastic-Based Analyses of Noncoherent Code Tracking Loops Over Wireless Fading Circumstances
Author :
Wu, Tsan-Ming ; Tsai, Tsung-Hua
Author_Institution :
Dept. of Electr. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
Abstract :
For band-limited pseudonoise signals, a noncoherent digital delay-lock loop (DDLL) equipped with a discrete automatic gain control algorithm under a RAKE scheme over frequency-selective fading channels is studied. Its associated statistical characteristics are analyzed based on the Nakagami-m stochastic process. The transition timing error probability density function (pdf) of the Chapman-Kolmogorov equation is evaluated to drive an analytical expression for the steady-state timing error pdf. The mean time to lose lock and the mean square tracking error with its corresponding Cramér-Rao lower bound (CRLB) under frequency-selective Nakagami-m fading environments are scrutinized, whereas their numerical results are confirmed by time-domain computer simulations. Moreover, the tracking performance of the DDLL in the presence of Doppler shifts is also examined.
Keywords :
Doppler shift; Nakagami channels; delay lock loops; mean square error methods; statistical distributions; stochastic processes; wireless channels; Chapman-Kolmogorov equation; Cramér-Rao lower bound; Doppler shifts; Nakagami-m stochastic process; RAKE scheme; band-limited pseudonoise signals; discrete automatic gain control algorithm; frequency-selective fading channels; mean square tracking error; noncoherent code tracking loops; noncoherent digital delay-lock loop; probability density function; steady-state timing error pdf; stochastic-based analyses; transition timing error pdf; wireless fading circumstances; Delay; Doppler shift; Fading; Gain control; Noise; Tracking loops; Cramér–Rao lower bound (CRLB); digital delay-lock loop (DDLL); discrete automatic gain control (AGC); frequency-selective Nakagami- $m$ fading; mean time to lose lock (MTLL); pseudonoise (PN) code tracking;
Journal_Title :
Vehicular Technology, IEEE Transactions on
DOI :
10.1109/TVT.2011.2175012