DocumentCode
1372329
Title
Investigation of Power Dissipation Mechanisms in Coated Conductors at High Current Densities Based on Ultra-Fast Pulsed Current Measurements
Author
Bernstein, Pierre ; McLoughlin, Connor ; Thimont, Yohann ; Sirois, Frédéric ; Coulombe, Jonathan
Author_Institution
CRISMAT, ENSICAEN, Caen, France
Volume
21
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
3417
Lastpage
3420
Abstract
In this contribution, we report and discuss the physical meaning of pulse current measurements carried out on coated conductors (CCs) consisting of a superconducting YBCO film deposited on a Hastelloy substrate and coated with a thin metallic layer. The high current (up to 1000 A) and short duration pulses (from 10 μs to 1 ms) have allowed us to determine the current-voltage characteristics of two different samples in a situation near that of zero injected energy, and therefore remove the bias resulting from the temperature rise during the measurement. The characteristics obtained show a flux creep region and two linear regimes. The first linear regime is the flux flow regime. In this regime, we show that the vortex velocity is a constant that depends on the metal film resistivity. The second linear regime is ohmic and his origin is less clear. We propose models describing both linear regimes, that are in agreement with the measurements. Finally, we discuss the consequences of these results for the applications of the coated conductors in devices for power systems, especially fault current limiters and power transmission cables.
Keywords
current density; electrical resistivity; fault current limiters; flux creep; flux flow; high-temperature superconductors; superconducting thin films; Hastelloy substrate; YBCO; coated conductors; current-voltage characteristics; fault current limiters; flux creep region; high current density; metal film resistivity; power dissipation; power transmission cables; superconducting YBCO film; thin metallic layer; ultra-fast pulsed current measurement; vortex velocity; Conductivity; Conductors; Current measurement; Resistance; Voltage measurement; Yttrium barium copper oxide; Fault current limiters; flux flow; high-temperature superconductors; resistivity measurement; superconducting tapes; yttrium compounds;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2010.2082484
Filename
5624592
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