• DocumentCode
    1374535
  • Title

    Frequency analysis of electrical impedance tomography system

  • Author

    Szczepanik, Zdzislaw ; Rucki, Zbigniew

  • Author_Institution
    Fac. of Electron., Wroclaw Univ., Poland
  • Volume
    49
  • Issue
    4
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    844
  • Lastpage
    851
  • Abstract
    An equivalent four-terminal model of an impedance tomography sensor in the measuring channel is presented. The frequency dependence of the potential difference measured between voltage electrodes of the sensor is analyzed theoretically and compared with the results of experiments carried out in the range 10 Hz-20 kHz. A good agreement is found. Results of the analysis revealed the frequency range of the measuring signal (10 Hz-5 kHz in the considered case) for which the potential difference is constant or varies insignificantly. At higher frequencies (more than 5 kHz), however, an evident variability was found-the higher the frequency, the higher potential difference. This results from the impedance characteristic of the tomography system including interfacial layer impedances, parasitic capacitances (particularly between the electrodes of the sensor) as well as signal source and voltmeter parameters. Analysis of the frequency characteristic of any individual tomography system is suggested to select the appropriate frequency of measuring signal and hence to avoid variability in the measured potential difference
  • Keywords
    electric impedance imaging; equivalent circuits; frequency-domain analysis; tomography; 10 Hz-20 kHz; 10 Hz-5 kHz; above 5 kHz; electrical impedance tomography; frequency analysis; frequency characteristic; impedance tomography sensor; interfacial layer impedances; parasitic capacitances; signal source; voltage electrodes; voltmeter parameters; Capacitive sensors; Electrical capacitance tomography; Electrodes; Frequency dependence; Frequency measurement; Impedance measurement; Parasitic capacitance; Sensor phenomena and characterization; Signal analysis; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.863936
  • Filename
    863936