DocumentCode
1374597
Title
Modeling the p-n junction i-u characteristic for an accurate calibration-free temperature measurement
Author
Kanoun, Olfa
Author_Institution
Univ. of the Federal Armed Forces Munich, Neubiberg, Germany
Volume
49
Issue
4
fYear
2000
fDate
8/1/2000 12:00:00 AM
Firstpage
901
Lastpage
904
Abstract
The p-n junction i-u characteristic model is decisive for the accuracy enhancement of calibration-free temperature measurement. In this paper, we give a survey of adapted physically-based p-n junction i-u characteristic models, such as the Ebers-Moll2 the Ebers-Moll3 and the Gummel-Poon model. Furthermore, we build new models through polynomial extensions to the fundamental Shockey model. The considered models were investigated with regard to the application of calibration-free temperature measurement. Experimental results show a model improvement with both physically and mathematically-based models
Keywords
curve fitting; measurement errors; p-n junctions; polynomial approximation; semiconductor device models; temperature measurement; Ebers-Moll models; Gummel-Poon model; accurate measurement; bipolar transistors; calibration-free temperature measurement; fundamental Shockey model; mathematically-based models; p-n junction i-u characteristic model; parameter extraction; physically-based models; polynomial extensions; resistance effects; systematic model errors; Calibration; Current measurement; Diodes; Electrical resistance measurement; Mathematical model; P-n junctions; Parameter extraction; Polynomials; Temperature measurement; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.863946
Filename
863946
Link To Document