• DocumentCode
    1374597
  • Title

    Modeling the p-n junction i-u characteristic for an accurate calibration-free temperature measurement

  • Author

    Kanoun, Olfa

  • Author_Institution
    Univ. of the Federal Armed Forces Munich, Neubiberg, Germany
  • Volume
    49
  • Issue
    4
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    901
  • Lastpage
    904
  • Abstract
    The p-n junction i-u characteristic model is decisive for the accuracy enhancement of calibration-free temperature measurement. In this paper, we give a survey of adapted physically-based p-n junction i-u characteristic models, such as the Ebers-Moll2 the Ebers-Moll3 and the Gummel-Poon model. Furthermore, we build new models through polynomial extensions to the fundamental Shockey model. The considered models were investigated with regard to the application of calibration-free temperature measurement. Experimental results show a model improvement with both physically and mathematically-based models
  • Keywords
    curve fitting; measurement errors; p-n junctions; polynomial approximation; semiconductor device models; temperature measurement; Ebers-Moll models; Gummel-Poon model; accurate measurement; bipolar transistors; calibration-free temperature measurement; fundamental Shockey model; mathematically-based models; p-n junction i-u characteristic model; parameter extraction; physically-based models; polynomial extensions; resistance effects; systematic model errors; Calibration; Current measurement; Diodes; Electrical resistance measurement; Mathematical model; P-n junctions; Parameter extraction; Polynomials; Temperature measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.863946
  • Filename
    863946